Services
Metroltek provides a wide range of consulting capabilities to serve the test and measurement industry. Metroltek will collaborate with the customer to understand the requirements. Once the requirements are understood, Metroltek will define them in a statement of work document. Metroltek will then develop the application and/or train as the work requires. Finally Metroltek will help the customer deploy a developed application.
Data Acquisition and Test System Development
Metroltek can provide development solutions for the hardware platforms:
PXI, GPIB, VXI, USB and general Serial.
Software Development
Metroltek can provide software programs to your specifications in
the following software platforms:
- National Instruments LabVIEW
- LabVIEW plug and play instrument drivers
- National Instruments TestStand
- Visual Basic
- Visual Basic for Applications (VBA)
- c# .NET - See products
page to learn about a complimentary MSChart application and
code library that is provided when a minimum amout of consulting
hours is purchased.
Database Design
Metroltek provide database design, setup assistance and
programmability for the following databases:
- Microsoft Access
- SQL Server 2000
- SQL Server 2005
Statistical Process Control Implementation
Metroltek can help you specify and implement the appropriate SPC
features for your test and measurement application. Examples include
real-time control chart style yield monitoring, XR-R monitoring of
variables data controlled by the process, mistake proofing the test
process, etc.
Metrology
- Measurement System Analysis
- Gage R&R
- Determining appropriate instrument for task
Training of Associated Technologies
Metroltek can provide custom training either on-site at your
location or at Metroltek. Training modules can be custom designed to
your specification to provide the most relevant topics to suit your
needs. Metroltek can also customize the days and times to make sure
the training accommodates your staff's schedule.