A Test and Measurement Automation Company

 Jim Dougherty - President

Sale: sales@metroltek.com

 

Tutorials

Metroltek is now offering a series of complimentary on-site or web based tutorials called Mastering Test Technology. Dates and times can be arranged to accommodate your schedule. Metroltek will be pleased schedule a time that spans over the lunch period to minimize downtime of your test engineering staff. Each presentation lasts about one to two hours depending on questions and how deeply particular tutorials are covered. An optional quiz can be given at the end of each training module. A Certificate of Completion will be awarded to each participant. See below for a list of the training modules:

Demystify Database Applications using the NI LabVIEW Database Toolkit provides an overview of database design and demonstrates how to insert, update, delete and select records using simulated test applications. The Microsoft SQL Server Express database engine is used for this training module, but the principles can be applied to any ODBC compliant relational database.

Statistical Process Control for Test Engineers teaches fundamentals of quality engineering for test applications so that test engineers can effectively apply the principles to their own test applications. Both discrete data and continuous data statistical principles are covered. Advanced topics such as outlier detection and data simulation are included in this training module.

Build Statistical Process Control into your Test Applications shows how to apply principles provided in Statistical Process Control for Test Engineers into real world test applications. Simulated test applications are used for demonstration purposes to include simulating a data set, setting up a failure alarm and illustrating sampling variation. Creating a statistically based Run Plot and Histogram is also demonstrated.

Metrology for Test Engineers covers basic metrology fundamentals such as accuracy, precision and resolution. Also covered are methods to select the appropriate instrument, assess net accuracy across a range, and how to improve upon the manufacturers stated specifications. The GAGE R&R procedure used to assess a test instrument or system capability in light of multiple operators and systems is also covered.

Search Routines For Test Applications shows how to effectively apply search routines in test applications when this is necessary to adjust instruments or set DUT conditions. Search methods covered are the Sequential Search, the Binary Search, and the Linear Approximation. The tutorial also shows when to use a particular search method.

Using .NET Controls in LabVIEW shows how to include and apply .NET controls inside LabVIEW. This is useful when a desired control functionality is not already available in LabVIEW, and a particular .NET control can provide the necessary features. The tutorial shows how to place a .NET control on the front panel and use capabilities of the LabVIEW .NET pallet functions to code an application using the DataGridView .NET control.


Contact Jim Dougherty at sales@metroltek.com for additional information.