Recently I've had a need to include robust and complex math calculations in my c# applications such as polynomial curve fitting, calculus and advanced statistics. I am pleased to say I've found an excellent .NET math code library called NMath from CenterSpace Software. The company is extremely customer friendly, has both email and phone support, and has an easy to use object model. Check them out if you need this kind of functionality.
Two common ways of visualizing a distribution of tested UUTs is to use a Histogram or a BoxPlot as shown below. Of special importance are points that fall outside the expected population, otherwise known as outliers. If the population comes from a passing universe, outliers may still be of concern since they may pose a reliability or intermittent problem. For example, a junction leakage of a power FET may indicate a surface leakage issue that may, in time, fail in the end applications. Another example is an outlier in a "tested good" power supply module. This may indicate improperly built magnetic components that may eventually fail intermittently or produce internal hot spots leading to eventual failure. In the Histogram, the red area are the Histogram bins and the top section are the individual data points. Statistical outliers can be determined as follows:
Note that the main difference between the two types of distribution charts is that a Histogram deals with bins of data and the BoxPlot deals in percentiles. LabVIEW has many statistical function that enable adding SPC to your application. I use the functions extensively in my applications and am glad I don't have to revert to a third party tool or write my own. Here are a few of my favorites:
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AuthorJim Dougherty, owner of Metroltek with specialties in national Instruments LabVIEW, C#, database and SPC (statistical process control) and, test system design. Archives
January 2015
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